情报学报  2023, Vol. 42 Issue (6): 663-680    DOI: 10.3772/j.issn.1000-0135.2023.06.003
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Patent Valuation Method Based on a Combination of Feature Stitching, Label Migration, and Deep Learning
Zhao Xuefeng1, Hu Jinjin1, Wu Delin1, Wu Weiwei2, Sun Andong3, Zhao Tao4
1.School of Economics and Management, Harbin Institute of Technology, Shenzhen, Shenzhen 518000
2.School of Management, Harbin Institute of Technology, Harbin 150000
3.Shenzhen Ward Intellectual Property Agency, Shenzhen 518000
4.Shenzhen Yingfeng Intellectual Property Consulting Co., Ltd, Shenzhen 518000