情报学报  2022, Vol. 41 Issue (1): 50-61    DOI: 10.3772/j.issn.1000-0135.2022.01.006
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Automatic Mapping Method and Empirical Research of U.S. Commerce Control List Data and Patent Data
Lyu Lucheng1,2, Han Tao1,2, Chen Fang1, Wang Xuezhao1,2, Zhao Yajuan1,2, Guo Shijie1,2
1.National Science Library, Chinese Academy of Sciences, Beijing 100190
2.Department of Library, Information and Archives Management, School of Economics and Management, University of Chinese Academy of Sciences, Beijing 100190