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| Research on Key Patent Identification for Solving the Technology Dilemma of “Neck Stuck” |
| Zhu Jiahui1, Zhou Xiao1, Wang Bo2, Ren Qiaoyang1, Wang Dan3 |
1.School of Economics and Management, Xidian University, Xi’an 710126
2.Xi’an Institute of Electromechanical Information Technology, Xi’an 710065
3.School of Economics and Management, Guangxi Normal University, Guilin 541004 |
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Abstract With foreign restrictions on technology and products in the chip field, science and technology leading enterprises and institutions in China are working together to help break through the “Neck Stuck” technologies to achieve localization replacement. The key patents with breakthrough potential in “Neck Stuck” technology problems in China must be identified and targeted fine-grained solutions must be provided to help China achieve technology breakthrough and layout technology innovation strategy. On the basis of generating Chinese and foreign patent technology-effect texts with a large model, this study identifies the domestic key patents that can solve the technology problems of “Neck Stuck” by comparing the technology-effect texts of foreign core and domestic patents. The research innovation is mainly reflected in two aspects: (1) in the generation of technology-effect texts, the use of a large model as a text generation tool makes up for the mechanical extraction method and effectively reduces the degree of expert participation; (2) when identifying key patents, the deep correspondence of “problem-solution” is considered, and the Chinese and foreign patents are benchmarked from the underlying logic of technology rather than the surface of technical text, such that the identified Chinese key patents are more problem-oriented. Finally, this study considers the field of AI chips as an example to conduct an empirical research that verifies the feasibility of the proposed method and provides an effective way for China to break through the “Neck Stuck” technology dilemma.
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Received: 31 May 2024
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